The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Dec. 17, 2015
Applicants:

Allegro Microsystems, Llc, Worcester, MA (US);

Zf Friedrichshafen Ag, Friedrichshafen, DE;

Inventors:

Stefan Hakspiel, Meckenbeuren, DE;

Thomas Kerdraon, Lenzkirch, DE;

Andreas P. Friedrich, Metz-Tessy, FR;

Assignees:

ZF FRIEDRICHSHAFEN AG, Friedrichshafen, DE;

ALLEGRO MICROSYSTEMS, LLC, Worcester, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 5/20 (2006.01); G01D 5/14 (2006.01); F16H 61/00 (2006.01);
U.S. Cl.
CPC ...
G01D 5/147 (2013.01); F16H 61/00 (2013.01);
Abstract

A shifting device with two positive-locking shifting element halves includes a positive connection between the shifting element halves that is able to be established or released. The respective prevailing operating states of the shifting element halves are determined through a sensor device. The surface areas of an encoder contour relative to a measuring device are formed in a convex or concave manner, whereas a perpendicular gap between the surface areas of the encoder contour and a permanent magnet, starting from a joint area between the surface areas in the direction of an end area of the surface areas increases or decreases in each case.


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