The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Jul. 27, 2017
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Richard Kwant, Oakland, CA (US);

Anish Mittal, Berkeley, CA (US);

David Lawlor, Chicago, IL (US);

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/60 (2017.01); G06N 3/08 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G06N 3/0445 (2013.01); G06N 3/08 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

An approach is provided for object detection. The approach involves receiving a feature map encoding high level features of object contours detected in an image divided into a plurality of grid cells, and further encoding start locations of each detected object contour. The approach also involves selecting a grid cell including a start location of an object contour. The approach further involves determining a precise location of the start location within the grid cell. The approach further involves determining a set of feature values from a set of proximate grid cells. The approach further involves processing the precise location and the set of feature values using a machine learning network to output a displacement vector to indicate a next coordinate of the object contour, and updating a cursor of the machine learning network based on the displacement vector.


Find Patent Forward Citations

Loading…