The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Sep. 29, 2017
Applicant:

Kla-tencor Corporation, Milpitas, CA (US);

Inventors:

Bjorn Brauer, Beaverton, OR (US);

Vijay Ramachandran, Sunnyvale, CA (US);

Richard Wallingford, Forsyth, MO (US);

Scott Allen Young, Soquel, CA (US);

Assignee:

KLA-Tencor Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06T 7/00 (2017.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6255 (2013.01); G06K 9/6274 (2013.01); G06N 3/0454 (2013.01); G06T 7/001 (2013.01); G06T 7/0004 (2013.01); G06T 7/0008 (2013.01); G06K 2209/19 (2013.01); G06N 3/082 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30148 (2013.01);
Abstract

Systems and methods for providing an augmented input data to a convolutional neural network (CNN) are disclosed. Wafer images are received at a processor. The wafer image is divided into a plurality of references images each associated with a die in the wafer image. Test images are received. A plurality of difference images are created by differences the test images with the reference images. The reference images and difference images are assembled into the augmented input data for the CNN and provided to the CNN.


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