The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
Nov. 18, 2016
Via Alliance Semiconductor Co., Ltd., Shanghai, CN;
James R. Lundberg, Austin, TX (US);
VIA ALLIANCE SEMICONDUCTOR CO., LTD., Shanghai, CN;
Abstract
A scannable data synchronizer including an input circuit, first and second pass gates, first and second inverters, and a gate controller. The input circuit drives the data nodes to opposite logic states in response to an asynchronous input data signal in a normal mode and in response to scan data in a scan test mode. Each pass gate is coupled between one of the data nodes and a corresponding one of the capture nodes, and each has at least one control terminal. The inverters are cross-coupled between the second capture nodes. The gate controller can keep the pass gates at least partially open during a metastable condition of the capture nodes, and can close the pass gates when both capture nodes stabilize to opposite logic states. In the scan test mode, the scan data is used to test the latch or register functions of the scannable data synchronizer.