The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Mar. 23, 2018
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Jianyong Mo, Chandler, AZ (US);

Darren Vance, Gilbert, AZ (US);

Di Xu, Chandler, AZ (US);

Liang Zhang, Chandler, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G06T 7/00 (2017.01); G06T 1/00 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); G06T 1/0007 (2013.01); G06T 7/0004 (2013.01); G01N 2021/1742 (2013.01);
Abstract

Embodiments herein relate to identifying whether a threshold amount of material is on a surface. In particular, an apparatus may have an inspection module to receive an image of a surface captured by a camera, where the surface is illuminated by a light source positioned at an angle to the surface. The apparatus may then analyze the received image to identify a measurement of light intensity of one or more portions of the surface; and determine, based on the analysis, whether each of the one or more portions of the surface includes a threshold amount of a material on the surface.


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