The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

Dec. 05, 2016
Applicant:

Sumco Corporation, Tokyo, JP;

Inventors:

Takeshi Kadono, Tokyo, JP;

Kazunari Kurita, Tokyo, JP;

Assignee:

SUMCO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 27/146 (2006.01); H01L 21/02 (2006.01); C30B 25/18 (2006.01); C30B 25/20 (2006.01); C30B 29/06 (2006.01); H01J 37/317 (2006.01); H01L 21/265 (2006.01); H01L 31/18 (2006.01); H01L 21/322 (2006.01); H01L 21/324 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14687 (2013.01); C30B 25/186 (2013.01); C30B 25/20 (2013.01); C30B 29/06 (2013.01); H01J 37/3171 (2013.01); H01L 21/02381 (2013.01); H01L 21/02532 (2013.01); H01L 21/02658 (2013.01); H01L 21/26506 (2013.01); H01L 21/26566 (2013.01); H01L 21/324 (2013.01); H01L 21/3221 (2013.01); H01L 31/1804 (2013.01);
Abstract

A semiconductor epitaxial wafer production method that can increase the peak concentration of hydrogen in a surface portion of a semiconductor wafer after epitaxial layer formation is provided. A method of producing a semiconductor epitaxial wafer comprises: a first step of irradiating a surface of a semiconductor wafer with cluster ions containing hydrogen as a constituent element, to form a modifying layer formed from, as a solid solution, a constituent element of the cluster ions including hydrogen in a surface portion of the semiconductor wafer; a second step of, after the first step, irradiating the semiconductor wafer with electromagnetic waves of a frequency of 300 MHz or more and 3 THz or less, to heat the semiconductor wafer; and a third step of, after the second step, forming an epitaxial layer on the modifying layer of the semiconductor wafer.


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