The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

Aug. 15, 2016
Applicant:

Adesto Technologies Corporation, Santa Clara, CA (US);

Inventor:

Bard M. Pedersen, Fremont, CA (US);

Assignee:

Adesto Technologies Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H01L 21/66 (2006.01); H01L 23/00 (2006.01); H01L 23/12 (2006.01); H01L 23/31 (2006.01); H01L 23/50 (2006.01); H01L 23/498 (2006.01);
U.S. Cl.
CPC ...
H01L 22/32 (2013.01); G01R 31/2818 (2013.01); H01L 23/12 (2013.01); H01L 23/3114 (2013.01); H01L 23/498 (2013.01); H01L 23/50 (2013.01); H01L 24/05 (2013.01); H01L 24/06 (2013.01); H01L 24/13 (2013.01); H01L 23/3171 (2013.01); H01L 2224/02371 (2013.01); H01L 2224/02373 (2013.01); H01L 2224/0401 (2013.01); H01L 2224/05124 (2013.01); H01L 2224/0612 (2013.01); H01L 2224/11 (2013.01); H01L 2224/13024 (2013.01); H01L 2924/1443 (2013.01);
Abstract

A device configured for WLCSP, can include: a first pad; a test pad offset from the first pad; a first RDL path that connects the first pad to the test pad; and a second RDL path that connects the test pad to a solder ball. In another case, a device configured for WLCSP can include: a first pad; a test pad offset from the first pad; a first RDL path that connects the first pad to a solder ball; and a second RDL path that connects the test pad to the solder ball. A wafer having devices configured for WLCSP, can include: a first device having a first pad; a second device having a test pad; a first RDL path that connects the first pad to a solder ball; and a second RDL path that connects the test pad to the solder ball.


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