The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

Feb. 15, 2017
Applicant:

Globalfoundries Singapore Pte. Ltd., Singapore, SG;

Inventors:

Lei Shi, Singapore, SG;

Bor Shen Chan, Singapore, SG;

Joselito Reyes Butiu, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); H01L 21/687 (2006.01); G01M 3/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67253 (2013.01); G01M 3/00 (2013.01); H01L 21/67115 (2013.01); H01L 21/68714 (2013.01);
Abstract

Device and method of configuring a device to process a wafer is disclosed. The device includes a wafer chuck configured to mount the wafer, a dry wafer processing chamber configured to enclose the wafer chuck, a humidity sensor configured to measure relative humidity (RH) at an outlet of the dry wafer processing chamber, a humidity controller coupled to the humidity sensor, the humidity controller being configured to detect a change in RH above a threshold, and a process chamber controller coupled to the humidity controller. The change is triggered by a leakage in deionized water used as a coolant for cooling the wafer chuck and the wafer during the processing. The process chamber controller is configured to trigger a shutdown of the processing of the wafer in response to the leakage.


Find Patent Forward Citations

Shi, Lei. (2019). Method and system for detecting a coolant leak in a dry process chamber wafer chuck (U.S. Patent No. 10395955). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10395955

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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