The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Dec. 05, 2017
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Kuniaki Onizawa, Hitachinaka, JP;

Koichi Obari, Tsuchiura, JP;

Junichi Oizumi, Kasumigaura, JP;

Shigemi Oba, Hitachinaka, JP;

Tetsuaki Abe, Hitachinaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/02 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/026 (2013.01); G01N 2035/00445 (2013.01); G01N 2035/0462 (2013.01);
Abstract

A sample processing system is configured for analyzing, preprocessing, or carrying out other operations for a biological sample such as blood or urea. With the sample processing system, it is possible to store samples to be stored in a thermally insulated state or specimens required for accuracy control in the thermally insulated state for preventing evaporation or denaturing of the samples and specimens. Also it is possible to carry in or out the samples, rack by rack, according to necessity. Further, the sample processing system is provided with a buffer unit in a cold container having a capability for cold storage and also by accessing a sample rack at random for carrying in or out a rack with a transfer mechanism provided outside of the cold container.


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