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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10381339 B1

PDFFull Text
Date of Patent:
Aug. 13, 2019

Filed:

Mar. 21, 2018

Integrated circuits with memory cell test circuits and methods for producing the same

Applicant:

Globalfoundries Singapore Pte. Ltd., Singapore, SG;

Inventors:

Chenchen Jacob Wang, Singapore, SG;

Teck Leong Wee, Singapore, SG;

Dimitri Houssameddine, Singapore, SG;

Assignee:

GLOBALFOUNDRIES SINGAPORE PTE. LTD., Singapore, SG;

Attorney:

Lorenz & Kopf, LLP

Primary Examiner:

Hsien Ming Lee

Int. Cl.
CPC ...
H01L 23/58 (2006.01); H01L 27/02 (2006.01); G11C 5/02 (2006.01); H01L 21/66 (2006.01); H01L 27/22 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0207 (2013.01); G11C 5/025 (2013.01); H01L 22/14 (2013.01); H01L 22/32 (2013.01); H01L 27/222 (2013.01);
Abstract

Integrated circuits and methods of producing the same are provided. In an exemplary embodiment, an integrated circuit includes a first and second dummy memory cell positioned within a dummy memory bank area. A first dummy top electrode overlies the first and second dummy memory cells, and is in electrical communication with the first and second dummy memory cells. A test circuit is in electrical communication with the first dummy top electrode.

Find Patent Forward Citations

Wang, Chenchen. (2019). Integrated circuits with memory cell test circuits and methods for producing the same (U.S. Patent No. 10381339). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10381339

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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