The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Nov. 30, 2015
Applicant:
Synopsys, Inc., Mountain View, CA (US);
Inventor:
Emil Gizdarski, Cupertino, CA (US);
Assignee:
Synopsys, Inc., Mountain View, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G01R 31/00 (2006.01); G01R 31/26 (2014.01); G01R 31/317 (2006.01); G01R 31/3183 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G06F 17/505 (2013.01); G01R 31/26 (2013.01); G01R 31/31718 (2013.01); G01R 31/318335 (2013.01); G01R 31/318555 (2013.01); G06F 17/5022 (2013.01); G06F 17/5081 (2013.01); G01R 31/31704 (2013.01); G01R 31/318547 (2013.01); G01R 31/318583 (2013.01); G06F 17/5045 (2013.01); G06F 2217/14 (2013.01); G06F 2217/78 (2013.01);
Abstract
Dynamic power-aware encoding method and apparatus is presented based on a various embodiments described herein. The experimental results confirmed that a desirable reduction in the toggling rate in the decompressed test stimulus is achievable by reasonable overhead (ATPG time, hardware overhead and pattern inflation) typically without degradation of a compression ratio. The performed experimental evaluation confirms that the described embodiments can support aggressive scan compression, efficient dynamic pattern compaction and a reduction of toggling rate in the decompressed test stimulus.