The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Jan. 31, 2018
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Yi-Hua Cheng, Chiayi County, TW;

Yen-Hsun Wu, Kaohsiung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 21/311 (2006.01); H01L 21/306 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02032 (2013.01); H01L 21/0228 (2013.01); H01L 21/02148 (2013.01); H01L 21/30625 (2013.01); H01L 21/31111 (2013.01);
Abstract

Methods are provided for recycling a dummy wafer so that the dummy wafer may be repeatedly used in a deposition process. The dummy wafer includes a substrate and an oxide layer on the substrate that is formed by the deposition process. A thickness of the oxide layer on the dummy wafer may be measured, and the dummy wafer may be subjected to recycling depending on whether the measured thickness of the oxide layer exceeds a threshold thickness. The dummy wafer is recycled by removing the oxide layer, which may be accomplished by performing an etching process. A mechanical polishing process may be performed to smooth the surface of the substrate. The dummy wafer may then be reused in a subsequent deposition process.


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