The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Mar. 31, 2017
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Richard Kwant, Oakland, CA (US);

Anish Mittal, Berkeley, CA (US);

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00798 (2013.01); G06K 9/4633 (2013.01); G06K 9/4638 (2013.01); G06T 7/11 (2017.01); G06T 2207/20021 (2013.01);
Abstract

An approach is provided for parametric representation of lane lines. The approach involves segmenting an input image into grid cells. The approach also involves processing a portion of the input image in each grid cell to detect lane lines. The approach further involves, for each grid cell in which lane lines are detected, determining intercepts of the lane lines with edges of the grid cell, and slopes of the lane lines at the intercepts. The approach further involves generating a parametric representation of the lane lines for each grid cell. The parametric representation encodes the intercepts and slopes into a data structure for each grid cell. The approach further involves providing an output parametric representation for the input image that aggregates the parametric representations of each grid cell.


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