The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Jul. 01, 2017
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

David J. Pelster, Longmont, CO (US);

Sudhakar Ayyasamy, El Dorado Hills, CA (US);

Mark Anthony S. Golez, Folsom, CA (US);

Yogesh B. Wakchaure, Folsom, CA (US);

Yu Du, Santa Clara, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/00 (2006.01); G06F 9/30 (2018.01); G06F 12/02 (2006.01); G06F 15/78 (2006.01); H03K 19/177 (2006.01); G06F 3/06 (2006.01); G06F 12/06 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G06F 9/30003 (2013.01); G06F 3/0611 (2013.01); G06F 11/004 (2013.01); G06F 12/0238 (2013.01); G06F 12/0638 (2013.01); G06F 15/7867 (2013.01); H03K 19/1776 (2013.01);
Abstract

Technology to dynamically modulate read granularity of a memory device. A computing system may include a controller and one or more memory devices coupled to the controller, the one or more memory devices including instructions, which when executed by the controller, may cause the computing system to determine whether a read to a memory device satisfies a sub-page read policy. In addition, the instructions, when executed, may cause the computing system to issue a sub-page read command to retrieve data from the memory device at sub-page granularity when the read satisfies the sub-page read policy. Moreover, the instructions, when executed, may cause the computing system to issue a full-page read command to retrieve the data at full-page granularity when the read does not satisfy the sub-page read policy or when a read for a segment of sequentially stored data does not satisfy the sub-page read policy.


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