The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Jan. 23, 2014
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/04 (2006.01); G01R 31/28 (2006.01); G11C 29/06 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2855 (2013.01); G11C 7/04 (2013.01); G11C 29/06 (2013.01); G11C 29/56 (2013.01);
Abstract
To include in a device a controller to control operation of the device in a normal-operation mode and in a test mode for performing one or more tests including an accelerated aging test, a temperature sensor to measure operating temperature of the device, and an overheat protection circuit to prevent overheating of the memory device during the test mode. With this overheat protection circuit, a device may undergo an efficient and reliable accelerated aging test with reduced or non-existent, possibility of suffering an overheat damage.