The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Sep. 18, 2017
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi-shi, Kanagawa-ken, JP;

Inventors:

Shunpei Yamazaki, Tokyo, JP;

Seiji Yasumoto, Tochigi, JP;

Naoto Goto, Tochigi, JP;

Satoru Idojiri, Tochigi, JP;

Assignee:

Semiconductor Energy Laboratory Co., Ltd., Atsugi-shi, Kanagawa-ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/57 (2014.01); G02F 1/1362 (2006.01); H01L 27/12 (2006.01); H01L 27/32 (2006.01); H01L 51/00 (2006.01); G02F 1/136 (2006.01);
U.S. Cl.
CPC ...
B23K 26/57 (2015.10); G02F 1/136286 (2013.01); H01L 27/124 (2013.01); H01L 27/1225 (2013.01); H01L 27/1266 (2013.01); H01L 27/3276 (2013.01); H01L 51/003 (2013.01); G02F 2001/13613 (2013.01); G02F 2201/44 (2013.01);
Abstract

The yield of a manufacturing process of a semiconductor device is increased. The mass productivity of the semiconductor device is increased. The semiconductor device is manufactured by performing a step of performing plasma treatment on a first surface of a substrate; a step of forming a first layer over the first surface with the use of a material containing a resin or a resin precursor; a step of forming a resin layer by performing heat treatment on the first layer; and a step of separating the substrate and the resin layer from each other. In the plasma treatment, the first surface is exposed to an atmosphere containing one or more of hydrogen, oxygen, and water vapor.


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