The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2019
Filed:
Feb. 07, 2018
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Cho-Ying Lu, Hillsboro, OR (US);
Hyung-Jin Lee, Portland, OR (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 7/01 (2006.01); H03M 1/12 (2006.01); G01K 7/14 (2006.01); G01K 15/00 (2006.01); H03M 1/10 (2006.01); H03M 1/46 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1061 (2013.01); G01K 7/01 (2013.01); G01K 7/14 (2013.01); G01K 15/005 (2013.01); H03M 1/1004 (2013.01); H03M 1/1019 (2013.01); H03M 1/1028 (2013.01); H03M 1/1215 (2013.01); H03M 1/462 (2013.01); G01K 2219/00 (2013.01);
Abstract
An apparatus is provided which comprises: a thermal sensor comprising one or more n-type devices or p-type devices that suffer from subthreshold factor variation, wherein the thermal sensor is to generate an output digital code representing a temperature; and a calibration circuitry coupled to the thermal sensor, wherein the calibration circuitry is to trim the effects of subthreshold factor variation from the output digital code.