The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Jun. 13, 2018
Applicant:

Atomera Incorporated, Los Gatos, CA (US);

Inventor:

Kalipatnam Vivek Rao, Grafton, MA (US);

Assignee:

ATOMERA INCORPORATED, Los Gatos, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 29/15 (2006.01); H01L 27/108 (2006.01); H01L 29/08 (2006.01); H01L 29/10 (2006.01); H01L 29/423 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/12 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 29/152 (2013.01); H01L 27/10814 (2013.01); H01L 27/10823 (2013.01); H01L 27/10876 (2013.01); H01L 27/10888 (2013.01); H01L 27/10894 (2013.01); H01L 27/10897 (2013.01); H01L 29/0847 (2013.01); H01L 29/1033 (2013.01); H01L 29/1037 (2013.01); H01L 29/1054 (2013.01); H01L 29/15 (2013.01); H01L 29/4236 (2013.01); H01L 29/66704 (2013.01); H01L 29/7825 (2013.01); H01L 21/02507 (2013.01); H01L 29/122 (2013.01);
Abstract

A semiconductor device may include a substrate, at least one memory array comprising a plurality of recessed channel array transistors (RCATs) on the substrate, and periphery circuitry adjacent the at least one memory array and including a plurality of complementary metal oxide (CMOS) transistors on the substrate. Each of the CMOS transistors may include spaced-apart source and drain regions in the substrate and defining a channel region therebetween, a superlattice extending between the source and drain regions in the channel region, and a gate over the superlattice and between the source and drain regions. The superlattice may include a plurality of stacked groups of layers, with each group of layers including a plurality of stacked base semiconductor monolayers defining a base semiconductor portion, and at least one non-semiconductor monolayer constrained within a crystal lattice of adjacent base semiconductor portions.


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