The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Sep. 07, 2016
Applicant:

Ngk Insulators, Ltd., Nagoya, JP;

Inventors:

Yukio Miyairi, Nagoya, JP;

Satoshi Sakashita, Nagoya, JP;

Kazuya Mori, Nagoya, JP;

Naoki Yoshida, Nagoya, JP;

Shingo Sokawa, Nagoya, JP;

Kenji Suzuki, Nagoya, JP;

Assignee:

NGK Insulators, Ltd., Nagoya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/08 (2006.01); B01D 46/24 (2006.01);
U.S. Cl.
CPC ...
G01N 15/082 (2013.01); B01D 46/247 (2013.01); B01D 46/2459 (2013.01); B01D 2273/18 (2013.01); G01N 2015/084 (2013.01);
Abstract

A CPU of an analysis apparatus performs a fluid analysis and derives transient distribution information that represents an accumulation distribution of a particulate layer on an inflow-side inner circumferential surface of a honeycomb structure at a time point after a short time interval Δt (step S). The CPU then repeatedly performs a fluid analysis by taking into account the transient distribution information derived previous time to repeatedly derive transient distribution information (steps Sto S) and then derives post-transient-analysis distribution information that represents the accumulation distribution of the particulate layer at a later time point (step S).


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