The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Oct. 03, 2011
Applicants:

Hiroshi Seki, Tokyo, JP;

Satoshi Shimakura, Tokyo, JP;

Inventors:

Hiroshi Seki, Tokyo, JP;

Satoshi Shimakura, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06Q 50/08 (2012.01); G06Q 10/06 (2012.01); G06Q 10/10 (2012.01);
U.S. Cl.
CPC ...
G06F 17/5004 (2013.01); G06Q 10/0631 (2013.01); G06Q 10/103 (2013.01); G06Q 50/08 (2013.01);
Abstract

The object is to enable easy acquisition of an element that is not design data. The technique is characterized in that when generating construction field management information used to manage a construction field, a construction field management device acquires measurement data that is three-dimensional shape data measured by a measurement device, and compares design data created by a designer with the acquired measurement data, thus extracting non-design data that is not the design data, from the measurement data. Also, as the non-design data, data of a scaffolding/tool and a component of the design data in a temporarily placed state are extracted, and the status of these is analyzed and displayed on a display unit.


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