The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2019
Filed:
Aug. 25, 2015
Carl Zeiss Microscopy Gmbh, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A microscopical imaging system for the widefield microscopical imaging of a sample. The imaging system includes a ray path with an objective, a tube lens system arranged behind the objective as seen from the sample, and a relay optical system with an objective-side component and an image-side component. The objective-side component includes at least one first objective-side lens group and a second objective-side lens group. The image-side component includes at least one first image-side lens group and a second image-side lens group. The relay optical system transfers an image of the exit pupil of the objective to a pupil plane between the objective-side component and the image-side component. The relay optical system transfers an image of the sample from an intermediate image plane to an image plane. The imaging system includes an adaptive optical element that is arranged at the pupil plane between the objective-side component and the image-side component.