The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Sep. 22, 2017
Applicant:

Fuji Electric Co., Ltd., Kawasaki-shi, Kanagawa, JP;

Inventors:

Hidekazu Tsuchida, Yokosuka, JP;

Tetsuya Miyazawa, Yokosuka, JP;

Yoshiyuki Yonezawa, Tsukuba, JP;

Tomohisa Kato, Tsukuba, JP;

Kazutoshi Kojima, Tsukuba, JP;

Takeshi Tawara, Tsukuba, JP;

Akihiro Otsuki, Mitaka, JP;

Assignee:

FUJI ELECTRIC CO., LTD., Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/36 (2006.01); H01L 21/02 (2006.01); C30B 25/20 (2006.01); C30B 29/36 (2006.01); H01L 29/861 (2006.01); H01L 29/868 (2006.01); H01L 21/04 (2006.01); H01L 29/16 (2006.01); C23C 16/32 (2006.01); C30B 25/18 (2006.01); C23C 16/56 (2006.01); H01L 29/66 (2006.01); H01L 29/06 (2006.01); H01L 29/737 (2006.01); H01L 29/739 (2006.01); H01L 29/74 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02529 (2013.01); C23C 16/325 (2013.01); C23C 16/56 (2013.01); C30B 25/183 (2013.01); C30B 25/20 (2013.01); C30B 29/36 (2013.01); H01L 21/0262 (2013.01); H01L 21/02378 (2013.01); H01L 21/02433 (2013.01); H01L 21/02447 (2013.01); H01L 21/02576 (2013.01); H01L 21/02579 (2013.01); H01L 21/02581 (2013.01); H01L 21/046 (2013.01); H01L 29/0619 (2013.01); H01L 29/16 (2013.01); H01L 29/1608 (2013.01); H01L 29/6606 (2013.01); H01L 29/7371 (2013.01); H01L 29/861 (2013.01); H01L 29/868 (2013.01); H01L 29/7395 (2013.01); H01L 29/74 (2013.01); H01L 29/78 (2013.01);
Abstract

A method for manufacturing an epitaxial wafer comprising a silicon carbide substrate and a silicon carbide voltage-blocking-layer, the method includes: epitaxially growing a buffer layer on the substrate, doping a main dopant for determining a conductivity type of the buffer layer and doping an auxiliary dopant for capturing minority carriers in the buffer layer at a doping concentration less than the doping concentration of the main dopant, so that the buffer layer enhances capturing and extinction of the minority carriers, the minority carriers flowing in a direction from the voltage-blocking-layer to the substrate, so that the buffer layer has a lower resistivity than the voltage-blocking-layer, and so that the buffer layer includes silicon carbide as a main component; and epitaxially growing the voltage-blocking-layer on the buffer layer.


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