The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Feb. 27, 2017
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); H04N 13/254 (2018.01); G06K 9/20 (2006.01); G01S 17/89 (2006.01); G01S 17/46 (2006.01); G01S 7/48 (2006.01); G06K 9/62 (2006.01); G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G01S 7/4802 (2013.01); G01S 17/46 (2013.01); G01S 17/89 (2013.01); G06K 9/2018 (2013.01); H04N 13/254 (2018.05); G06K 9/209 (2013.01); G06K 9/3233 (2013.01); G06K 9/6267 (2013.01); G06T 2207/10048 (2013.01);
Abstract
Systems, apparatuses, and/or methods to characterize a material. For example, and apparatus may include a pattern receiver to receive an IR pattern corresponding to non-uniform IR radiation that is to result from an interaction with a material, such as a translucent material. The apparatus may further include a characterizer to make a characterization of the material, such as a translucent material, based on the IR pattern. The characterization may differentiate the material, such as a translucent material, from one or more other materials, such as one or more other translucent materials.