The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Oct. 19, 2018
Applicant:
Shenzhen Xpectvision Technology Co., Ltd., Shenzhen, CN;
Inventors:
Peiyan Cao, Shenzhen, CN;
Huabin Cheng, Shenzhen, CN;
Assignee:
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD., Shenzhen, CN;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); G01T 1/20 (2006.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
G01T 1/247 (2013.01); G01T 1/2018 (2013.01); G01T 1/24 (2013.01); G01T 1/243 (2013.01); G01T 1/2928 (2013.01);
Abstract
Disclosed herein is a method to measure an intensity distribution of X-ray using an X-ray detector, the method comprising: determining values of dark current at at least three locations on the X-ray detector, wherein the three locations are not on a straight line; determining a spatial variation of absorptance of the X-ray using the values of the dark current; measuring an apparent intensity distribution of the X-ray; determining the intensity distribution by removing a contribution of the spatial variation the absorptance from the apparent intensity distribution.