The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Jul. 04, 2011
Kumiko Kamihara, Mito, JP;
Satoshi Mitsuyama, Tokyo, JP;
Tomonori Mimura, Kasama, JP;
Chihiro Manri, Kawagoe, JP;
Kumiko Kamihara, Mito, JP;
Satoshi Mitsuyama, Tokyo, JP;
Tomonori Mimura, Kasama, JP;
Chihiro Manri, Kawagoe, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An automatic analyzer includes sample vessels containing samples to be measured and; reaction vessels in which to mix a sample and a reagent. A sample dispenserdispenses a sample from any of the sample vessels to any of the reaction vessels. A reagent dispenser dispenses a reagent from a reagent vessel to a reaction vessel, and a stirrer stirs the sample-reagent mix contained in the reaction vessel. A photometric measurement unit is provided for obtaining multiple measurement data points during the progress of reaction of a mixed solution. At least one approximation formula is performed and an approximation curve from the measurement data points is generated. A shape descriptor is calculated from the approximation curve and abnormalities based on the shape descriptor are determined. This not only allows abnormalities to be detected accurately from each measurement result, but also allows the causes of the abnormalities to be identified.