The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Oct. 13, 2016
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventor:

David J. Zimmerman, El Dorado Hills, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 5/04 (2006.01); G11C 29/32 (2006.01); G11C 11/408 (2006.01); G01R 31/3177 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G11C 29/32 (2013.01); G01R 31/3177 (2013.01); G01R 31/318513 (2013.01); G01R 31/318558 (2013.01); G01R 31/318572 (2013.01); G11C 11/4087 (2013.01); G11C 5/04 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A boundary scan chain for stacked memory. An embodiment of a memory device includes a system element and a memory stack including one or more memory die layers, each memory die layer including input-output (I/O) cells and a boundary scan chain for the I/O cells. A boundary scan chain of a memory die layer includes a scan chain portion for each of the I/O cells, the scan chain portion for an I/O cell including a first scan logic multiplexer a scan logic latch, an input of the scan logic latch being coupled with an output of the first scan logic multiplexer, and a decoder to provide command signals to the boundary scan chain.


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