The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Aug. 15, 2013
Carl Zeiss Microscopy Gmbh, Jena, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
A laser scanning microscope having a laser source for fluorescence excitation; a scanning mirror arrangement for scanning a specimen and scanning optics for generating a diffraction-limited reference image plane as a first intermediate image plane; an optical system for demagnified imaging of the reference plane in a second intermediate image plane; an axially slideable mirror in the second intermediate image plane; a beam splitter arrangement between the reference image plane and the optical system; and a tube lens and a first microscope objective for imaging of the reference image plane into a specimen. The imaging of the image is effected with a magnification of M≠n/n' and/or a magnification of the second intermediate image plane into the specimen according to the equation with |ξ|≠, and/or the focal plane of the laser deviates from the axial position of the axially movable mirror across its scanning area in the second intermediate image plane.