The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Apr. 13, 2018
Applicant:
Bruker Nano, Inc., Tucson, AZ (US);
Inventors:
Chanmin Su, Ventura, CA (US);
Izhar Medalsy, Santa Barbara, CA (US);
Weijie Wang, Santa Barbara, CA (US);
Assignee:
Bruker Nano, Inc., Tucson, AZ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/14 (2010.01); G01Q 10/06 (2010.01); G01Q 20/02 (2010.01); G01Q 70/02 (2010.01); G01Q 60/38 (2010.01);
U.S. Cl.
CPC ...
G01Q 70/14 (2013.01); G01Q 10/06 (2013.01); G01Q 20/02 (2013.01); G01Q 70/02 (2013.01); G01Q 60/38 (2013.01);
Abstract
According to embodiments, a cantilever probe for use with an atomic force microscope (AFM) or scanning probe microscope (SPM) has a pad of conformable material that facilitates non-permanent adhesion through van der Waals interactions. Such removable probes and probe tips facilitate use of multiple tips or probes, while reducing the need for recalibration or repositioning.