The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Sep. 27, 2016
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Ping Guo, Beijing, CN;

Dongqing Zou, Beijing, CN;

Qiang Wang, Beijing, CN;

Baek Hwan Cho, Seoul, KR;

Keun Joo Park, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/128 (2018.01); H04N 13/122 (2018.01); H04N 13/239 (2018.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/128 (2018.05); H04N 13/122 (2018.05); H04N 13/239 (2018.05); H04N 2013/0081 (2013.01);
Abstract

A method and apparatus for acquiring an image disparity are provided. The method may include acquiring, from dynamic vision sensors, a first image having a first view of an object and a second image having a second view of the object; calculating a cost within a preset disparity range of an event of first image and a corresponding event of the second image; calculating an intermediate disparity of the event of the first image and an intermediate disparity of the event of the second image based on the cost; determining whether the event of the first image is a matched event based on the intermediate disparity of the event of the first image and the intermediate disparity of the event of the second image; and predicting optimal disparities of all events of the first image based on an intermediate disparity of the matched event of the first imaged.


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