The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Oct. 30, 2017
Anritsu Corporation, Kanagawa, JP;
ANRITSU CORPORATION, Kanagawa, JP;
Abstract
An end face inspection apparatus which inspects an end face of an test object, and includes optical system causing an image acquisition unit to form an image of an end face of a held test object, focusing degree changing means for changing a distance between the end face of the test object and a focal position of the optical system, and a control unit processing image data acquired in the image acquisition unit. The end face inspection apparatus acquires a series of image data which is output from the image acquisition unit at a preset time interval while the distance between the end face of the test object and the focal position of the optical system is changed, determines whether or not each piece of the image data is focused, and selects focused image data as image data for end face inspection.