The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Mar. 30, 2018
Applicant:

Sift Science, Inc., San Francisco, CA (US);

Inventors:

Fred Sadaghiani, San Francisco, CA (US);

Aaron Beppu, San Francisco, CA (US);

Jacob Burnim, San Francisco, CA (US);

Alex Paino, San Francisco, CA (US);

Assignee:

Sift Science, Inc., San Francisco, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G06F 17/10 (2006.01); G06N 20/00 (2019.01); G06F 21/55 (2013.01); G06N 3/08 (2006.01); G06F 21/57 (2013.01); G06N 7/00 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 21/552 (2013.01); G06F 21/554 (2013.01); G06F 21/577 (2013.01); G06N 3/08 (2013.01); G06N 7/005 (2013.01); G06F 17/50 (2013.01); G06F 2221/034 (2013.01);
Abstract

Systems and methods include: collecting digital threat scores of an incumbent digital threat machine learning model; identifying incumbent and successor digital threat score distributions; identifying quantiles data of the incumbent digital threat score distribution; collecting digital threat scores of a successor digital threat machine learning model; calibrating the digital threat scores of the successor digital threat score distribution based on the quantiles data of the incumbent digital threat score distribution and the incumbent digital threat score distribution; and in response to remapping the digital threat scores of the successor digital threat score distribution, publishing the successor digital scores in lieu of the incumbent digital threat scores based on requests for digital threat scores.


Find Patent Forward Citations

Sadaghiani, Fred. (2019). Systems and methods for calibrating a machine learning model (U.S. Patent No. 10339472). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10339472

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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