The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Jul. 22, 2015
Applicant:

Jeol Ltd., Tokyo, JP;

Inventor:

Kenichi Hachitani, Tokyo, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/36 (2006.01); G01R 33/54 (2006.01);
U.S. Cl.
CPC ...
G01R 33/3607 (2013.01); G01R 33/3621 (2013.01); G01R 33/543 (2013.01);
Abstract

In a magnetic resonance measurement apparatus, when a frequency of an observation nucleus falls within a high frequency band, a frequency conversion scheme is selected. In this case, an intermediate frequency signal is generated as an original signal, which is then frequency-converted to generate an RF transmission signal. An RF reception signal is converted into an intermediate frequency signal by frequency conversion, and is sampled. When the frequency of the observation nucleus falls within a low frequency band, a non-conversion scheme is selected. In this case, an RF transmission signal is generated as the original signal, and an RF reception signal is sampled.


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