The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Jan. 29, 2016
Lg Chem, Ltd., Seoul, KR;
Jung Hak Kim, Daejeon, KR;
Young Kook Kim, Daejeon, KR;
Kwang Joo Lee, Daejeon, KR;
Hee Jung Kim, Daejeon, KR;
Se Ra Kim, Daejeon, KR;
Jung Ho Jo, Daejeon, KR;
Seung Hee Nam, Daejeon, KR;
Ji Ho Han, Daejeon, KR;
LG CHEM, LTD., Seoul, KR;
Abstract
The present invention relates to a method for measuring metal ion permeability of a polymer film, comprising the steps of: applying a voltage to the polymer film at a temperature of 5° C. to 250° C., while one side of the polymer film is brought into contact with an electrolyte comprising metal ions, an organic solvent and an aqueous solvent; and measuring the change rate of resistance or change rate of current of the polymer film according to time, after the voltage is applied, and a device for measuring metal ion permeability of a polymer film used therefor.