The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Jun. 15, 2017
Applicant:

Asm Technology Singapore Pte Ltd, Singapore, SG;

Inventors:

Chi Wah Cheng, Hong Kong, HK;

Kai Fung Lau, Hong Kong, HK;

Hoi Shuen Tang, Hong Kong, HK;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/70 (2017.01); G01N 21/01 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/9503 (2013.01); G01N 21/01 (2013.01); G06T 7/0004 (2013.01); G06T 7/70 (2017.01); G01N 2201/0415 (2013.01); G06T 2207/30148 (2013.01);
Abstract

A method for automated alignment of electronic components with respect to one or more inspection devices for inspecting the electronic components, each electronic component having a plurality of side surfaces. The method comprises: positioning each electronic component relative to an imaging device; determining, by the imaging device, an angular offset and a linear offset between each side surface of the electronic component and the one or more inspection devices; positioning each electronic component relative to the inspection devices; effecting alignment between each side surface and the one or more inspection devices in accordance with the respective angular and linear offsets; and inspecting each side surface after effecting alignment between the side surface and the inspection devices.


Find Patent Forward Citations

Loading…