The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Jan. 24, 2014
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Kiyomi Yoshinari, Tokyo, JP;

Yasushi Terui, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/04 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/426 (2013.01); H01J 49/0031 (2013.01); H01J 49/0422 (2013.01); H01J 49/0431 (2013.01); H01J 49/429 (2013.01); H01J 49/4215 (2013.01); H01J 49/4225 (2013.01);
Abstract

An object of the invention is to provide a mass spectrometer system capable of obtaining a mass spectrum with high resolution as the mass number of an ion becomes higher. In the mass spectrometer system of the invention, a control unitcontrols a mass spectrometry unitso that a direct current voltage U, an amplitude V of a radio-frequency voltage, and a frequency F of the radio-frequency voltage, which are applied to a quadrupole electrode, are increased as a mass-to-charge ratio m/z of an ion of a target for mass spectrometry becomes larger. By controlling in this manner, the ion frequency when the ion passes through the inside of the mass spectrometry unitis increased as the mass number of an ion becomes higher, and therefore, it is possible to obtain the mass spectrum with higher resolution.


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