The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Oct. 24, 2014
Applicant:

Solido Design Automation Inc.;

Inventors:

Trent Lorne McConaghy, Berlin, DE;

Joel Cooper, Saskatoon, CA;

Jeffrey Dyck, Saskatoon, CA;

Megan Marsh, Saskatoon, CA;

Assignee:

Mentor Graphics Corporation, Wilsonville, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06F 11/07 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5022 (2013.01); G06F 11/076 (2013.01); G06F 11/0745 (2013.01); G06F 17/5036 (2013.01); G06N 7/005 (2013.01); G06F 2217/78 (2013.01); G06F 2217/80 (2013.01);
Abstract

A computer-implemented method for quickly analyzing the effect of process, voltage, temperature, and other variations when the variation analysis or circuit structure can be hierarchically composed into nested loops. The method has two main steps: first, it hierarchically generates a set of points and inserts them into a flat list of tuples, where each tuple contains a point from each level in the looping hierarchy. Second, it efficiently identifies and simulates failing tuples with the assistance of modeling to order the tuples to simulate. By using the present method, a designer does not have to simulate the full ECD at each and every statistical process point or PVT corner, which can same considerable time or compute effort.


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