The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
Aug. 31, 2016
Applicant:
Stmicroelectronics (Alps) Sas, Grenoble, FR;
Inventors:
Assignee:
STMICROELECTRONICS (ALPS) SAS, Grenoble, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/27 (2006.01); G06F 11/07 (2006.01); G11C 7/24 (2006.01); G11C 29/12 (2006.01); G11C 29/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/27 (2013.01); G06F 11/0778 (2013.01); G11C 7/24 (2013.01); G11C 29/12 (2013.01); G11C 2029/3602 (2013.01);
Abstract
Embodiments of the circuits described include a method wherein at least one command signal is activated. The activation of the at least one command signal causes a request to a testing circuit of a memory array to enter a memory test mode. The requested memory test mode permits at least part of the memory array to be read. In response to activation of the at least one command signal, a test control circuit initiates an overwrite sequence to overwrite the data stored in the memory array. The test control circuit enables the memory test mode once the overwrite sequence has been completed.