The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
Jul. 25, 2016
Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;
Rei Konishi, Tokyo, JP;
Akihisa Makino, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An automated analyzer makes light from a light source incident on a liquid mixture consisting of a sample and a reagent in a reactor vessel and, by ascertaining with a photodetector the quantity of light transmitted or scattered and the change in the wavelength, performs quantitative and qualitative analysis of an object component. When light other than from the light source such as light from outside is incident on the photodetector, since it is no longer possible to accurately measure the quantity of light and the change in the wavelength, it is also no longer possible to accurately measure the analysis of the object component. In particular, in the constitution of an analysis unit provided with a plurality of analysis ports, during analysis at one analysis port, due to various mechanisms accessing other analysis ports, disturbance light such as light reflected on this mechanism would enter the analysis port under analysis and sometimes have an effect on the measurement result. The present invention provides an automated analyzer that, by means of a first light shielding mechanism and a second light shielding mechanism having an opening part in an analysis unit provided with a plurality of analysis ports, does not allow disturbance light to be incident on the analysis port under analysis so that each mechanism is capable of accessing any analysis port.