The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Mar. 23, 2018
Applicant:

Carl Zeiss Vision International Gmbh, Aalen, DE;

Inventors:

Arne Ohlendorf, Tübingen, DE;

Siegfried Wahl, Donzdorf, DE;

Jesús-Miguel Cabeza Guillén, Aalen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/028 (2006.01); A61B 3/00 (2006.01); A61B 3/032 (2006.01); A61B 3/04 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0285 (2013.01); A61B 3/0041 (2013.01); A61B 3/032 (2013.01); A61B 3/04 (2013.01);
Abstract

A system determines the subjective refraction properties of an eye of a test subject perceiving a natural image. The system contains a memory in which at least one natural image is stored; a display device for displaying the at least one natural image from the memory; and a lens arrangement for adjusting various light-refracting elements in an optical path between the eye of the test subject and the display device. The lens arrangement is arranged at a predefined distance from the display device. A corresponding method and the use of a natural image for refraction determination are also disclosed.


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