The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Jun. 16, 2017
Mitutoyo Corporation, Kanagawa-ken, JP;
David William Sesko, Woodinville, WA (US);
Mitutoyo Corporation, Kanagawa-ken, JP;
Abstract
A scanning probe responsive in three axes is provided for use in a coordinate measuring machine. The scanning probe includes a frame, a stylus suspension portion and a stylus position detection portion. The stylus position detection portion includes a light source that is operated to radiate source light toward a position indicating element that is fixed relative to the stylus coupling portion. The position indicating element includes a position indicating emitter having an emitter material (e.g., phosphor) that inputs and absorbs the light from the light source and responds by outputting excitation light. In various implementations, the excitation light is directed as at least one of axial measurement light along an axial measurement spot path to form an axial measurement spot on an axial position sensitive detector and/or rotary measurement light along a rotary measurement spot path to form a rotary measurement spot on a rotary position sensitive detector.