The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Jun. 28, 2017
Applicant:

Cadence Design Systems, Inc., San Jose, CA (US);

Inventors:

Steven Lee Gregor, Oswego, NY (US);

Puneet Arora, Noida, IN;

Norman Robert Card, Vestal, NY (US);

Assignee:

CADENCE DESIGN SYSTEMS, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/38 (2006.01); G11C 29/36 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G01R 31/31703 (2013.01); G01R 31/31723 (2013.01); G11C 29/36 (2013.01);
Abstract

An exemplary memory arrangement can be provided, which can include, for example, a memory(ies), and an algorithmic memory unit(s) (AMU) coupled to the memory(ies), wherein the AMU includes a programmed testplan algorithm(s) configured to test the memory(ies). The AMU(s) can further include a hardwired testplan(s) configured to test the memory(ies). A Joint Test Action Group ('JTAG') controller may be coupled to the AMU(s), which can be configured to access logic of the programmed testplan algorithm(s). A direct access controller (DAC) can be coupled to the AMU(s), which can be configured to access internal nodes in the AMU(s). The DAC can be configured to activate the programmed testplan algorithm(s) using a minimally direct access pin interface in the AMU(s).


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