The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Apr. 29, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Brian P. Byrne, Austin, TX (US);

Adam R. Holley, Austin, TX (US);

Brian T. Lillie, Cedar Park, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G01C 21/36 (2006.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/06393 (2013.01); G01C 21/3691 (2013.01); G06N 5/04 (2013.01); G06Q 10/06375 (2013.01); G06Q 10/063 (2013.01);
Abstract

An approach is provided for providing spatio-temporal key performance indicators (ST-KPIs). The approach tracks metrics, such as crowd density, pertaining to a number of locations. The tracking is performed over time to develop a history of past values that correspond to the metrics. The history is used to predict a trend of future metrics at the locations with the trend resulting in predicted future values that correspond to the metrics at the locations. In this manner, the ST-KPIs reflect the predicted future values at the various locations that are being monitored. A city view is displayed to a user showing the current and predicted values at defined ST-KPI locations throughout the city.


Find Patent Forward Citations

Loading…