The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Apr. 18, 2016
Applicant:
Qualcomm Incorporated, San Diego, CA (US);
Inventors:
Anil Kota, San Diego, CA (US);
Sei Seung Yoon, San Diego, CA (US);
Bhadri Kubendran, San Diego, CA (US);
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G06F 21/64 (2013.01); G06F 3/06 (2006.01); G06F 11/10 (2006.01); G06F 11/263 (2006.01); G06F 21/78 (2013.01); G11C 17/14 (2006.01);
U.S. Cl.
CPC ...
G06F 21/55 (2013.01); G06F 3/065 (2013.01); G06F 3/0619 (2013.01); G06F 3/0679 (2013.01); G06F 11/108 (2013.01); G06F 11/2635 (2013.01); G06F 21/64 (2013.01); G06F 21/78 (2013.01); G11C 17/146 (2013.01);
Abstract
A method includes: reading a plurality of words from a one-time program (OTP) memory of a processing chip, wherein each of the words includes secure data for the chip and bits corresponding to a check pattern; comparing the bits corresponding to the check pattern to a preprogrammed check pattern; detecting an error based on comparing the bits corresponding to the check pattern to the preprogrammed check pattern; and performing an action by the processing chip in response to detecting the error.