The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Oct. 01, 2018
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventor:
Jae-Kwan Park, Cupertino, CA (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G11C 29/00 (2006.01); G06F 11/07 (2006.01); G11C 7/10 (2006.01); G11C 7/06 (2006.01); G11C 29/24 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0727 (2013.01); G06F 11/0751 (2013.01); G11C 7/062 (2013.01); G11C 7/065 (2013.01); G11C 7/1057 (2013.01); G11C 7/1063 (2013.01); G11C 29/24 (2013.01); G11C 2207/063 (2013.01);
Abstract
Apparatuses and methods for comparing a sense current representative of a number of failing memory cells of a group of memory cells and a reference current representative of a reference number of failing memory cells is provided. One such apparatus includes a comparator configured to receive the sense current and to receive the reference current. The comparator includes a sense current buffer configured to buffer the sense current and the comparator is further configured to provide an output signal having a logic level indicative of a result of the comparison.