The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Jul. 13, 2015
Carl Zeiss Microscopy Gmbh, Jena, DE;
Thomas Milde, Nausnitz, DE;
Max Funck, Potsdam, DE;
Carl Zeiss Microscopy GMBH, Jena, DE;
Abstract
The invention relates to a method of correcting illumination-dependent aberrations in a modular digital microscope comprising a coaxial bright field illumination apparatus, a motor-driven zoom apparatus, an objective, a digital image acquisition unit and an image processing unit. The method according to the invention is based on the use of calibration data, which are preferably stored in the image processing unit as a calibration data record. The calibration data record is established for each combination of objective and zoom and stored in a data memory. The method is integrated into the image processing unit for live-correction or available as software for image post-processing of microscope images. The invention further relates to a digital microscope.