The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
May. 11, 2017
Mentor Graphics Corporation, Wilsonville, OR (US);
Shi-Yu Huang, Taoyuan, TW;
Kun-Han Tsai, Lake Oswego, OR (US);
Wu-Tung Cheng, Lake Oswego, OR (US);
Tzu-Heng Huang, Kaohsiung, TW;
Mentor Graphics Corporation, Wilsonville, OR (US);
Abstract
An integrated circuit for on-chip speed grading comprises test circuitry comprising scan chains and a test controller; and wide-range clock signal generation circuitry comprising phase-locked loop circuitry and frequency divider circuitry. The wide-range clock signal generation circuitry is configured to generate a wide-range test clock signal for the test circuitry to conduct a structural delay test for on-chip speed grading. The wide-range test clock signal is generated based on a test clock signal associated with the test circuitry, a frequency range selection signal and a frequency setting signal.