The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Aug. 27, 2015
Mitutoyo Corporation, Kawasaki-shi, Kanagawa, JP;
Yasuhiro Tsujimoto, Kawasaki, JP;
Takefumi Kiwada, Nakatsugawa, JP;
MITUTOYO CORPORATION, Kawasaki, JP;
Abstract
A parameter setting method of a measuring instrument includes: reading model information, measurement-related setting items, and parameters corresponding to the setting items, which are stored in the measuring instrument, and temporarily storing the read data in a storage unit of a computer; displaying an appearance image of the measuring instrument corresponding to the model information on the screen and displaying icons for selecting an operation on the screen at predetermined positions of the appearance image on the screen in correlation with each other; displaying the setting item, which is able to be selected by an operation in the measuring instrument relevant to the predetermined position corresponding to the selected icon, on the screen when selection of the icon is received; receiving changing of the parameter corresponding to the setting item using the computer; and transmitting the changed parameter from the computer to the measuring instrument.