The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Mar. 24, 2017
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Gregg B. Lesartre, Fort Collins, CO (US);

Craig Warner, Plano, TX (US);

Martin Foltin, Fort Collins, CO (US);

Chris Michael Brueggen, Plano, TX (US);

Brian S. Birk, Corvallis, OR (US);

Harvey Ray, Fort Collins, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/29 (2006.01); G11C 29/52 (2006.01); G06F 11/10 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
H03M 13/2906 (2013.01); G06F 11/1048 (2013.01); G11C 29/52 (2013.01); G11C 2029/0409 (2013.01); G11C 2029/0411 (2013.01);
Abstract

In one example in accordance with the present disclosure, a system comprises a plurality of memory dies, a first region of memory allocated for primary ECC spread across a first subset of at least one memory die belonging to the plurality of memory die, wherein a portion of the primary ECC is allocated to each data block and a second region of memory allocated for secondary ECC spread across a second subset of at least one memory die included in the plurality of memory die. The system also comprises a memory controller configured to determine that an error within the first data block cannot be corrected using a first portion of the primary ECC allocated to the first data block, access the second region allocated for secondary ECC stored on the at least one memory die belonging to the plurality of memory die and attempt to correct the error using the primary and secondary ECC.


Find Patent Forward Citations

Loading…