The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Jun. 20, 2014
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Kinyip Phoa, Beaverton, OR (US);

Nidhi Nidhi, Hillsboro, OR (US);

Chia-Hong Jan, Portland, OR (US);

Ting Chang, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 29/66 (2006.01); H01L 29/06 (2006.01); H01L 29/08 (2006.01); H01L 21/8234 (2006.01); H01L 27/092 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7834 (2013.01); H01L 21/823412 (2013.01); H01L 21/823418 (2013.01); H01L 21/823456 (2013.01); H01L 27/0922 (2013.01); H01L 29/0684 (2013.01); H01L 29/0847 (2013.01); H01L 29/66621 (2013.01); H01L 29/7835 (2013.01); H01L 27/0924 (2013.01);
Abstract

High voltage transistors spanning multiple non-planar semiconductor bodies, such as fins or nanowires, are monolithically integrated with non-planar transistors utilizing an individual non-planar semiconductor body. The non-planar FETs may be utilized for low voltage CMOS logic circuitry within an IC, while high voltage transistors may be utilized for high voltage circuitry within the IC. A gate stack may be disposed over a high voltage channel region separating a pair of fins with each of the fins serving as part of a source/drain for the high voltage device. The high voltage channel region may be a planar length of substrate recessed relative to the fins. A high voltage gate stack may use an isolation dielectric that surrounds the fins as a thick gate dielectric. A high voltage transistor may include a pair of doped wells formed into the substrate that are separated by the high voltage gate stack with one or more fin encompassed within each well.


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