The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Jun. 06, 2016
Applicant:
John Bean Technologies Corporation, Chicago, IL (US);
Inventors:
Jon A. Hocker, Bothell, WA (US);
George R. Blaine, Lake Stevens, WA (US);
Craig E. Pfarr, Issaquah, WA (US);
Assignee:
John Bean Technologies Corporation, Chicago, IL (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/42 (2006.01); A22C 17/00 (2006.01); A22C 21/00 (2006.01); G01N 33/12 (2006.01); G05B 23/02 (2006.01); G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0205 (2013.01); A22C 17/0006 (2013.01); A22C 17/008 (2013.01); A22C 17/0086 (2013.01); A22C 21/0023 (2013.01); A22C 21/0053 (2013.01); G01N 3/42 (2013.01); G01N 33/12 (2013.01); G05B 19/0428 (2013.01); G05B 2219/31274 (2013.01); G05B 2219/40554 (2013.01);
Abstract
A system for measuring physical properties of a workpiece in motion which includes a conveyance assembly for conveying the workpiece, a scanning assembly for scanning the workpiece, and a measurement assembly for measuring at least one physical property of the workpiece while the workpiece is in motion.